Wafer Testing RF Probe| 40GHz Compact Manual Probe Station Failure Analysis FR 1
SKU: 9df91e6e49b89c9a0dde1820eb041e92 Andere elektronische Messgeräte

Wafer Testing RF Probe| 40GHz Compact Manual Probe Station Failure Analysis FR

$1.38
✓ Fabrikpreis MOQ: 1 PCS /PCS

MOQ

1 PCS

Lieferzeit

N/A Tage

Lagerbestand

10 Stück

Herkunft

CN

Marke / Lieferant

Shenzhen Yijie Testing Technology Co., Ltd.

Produktspezifikationen

Unit pcs
Price Note 源数据为面议占位价(<10元),待人工核实真实出厂价
Trade Term EXW
Markup Rate 0.03
Incoterm Note EXW 出厂价(非 FOB).美元价 = 人民币出厂价 × 1.03 ÷ 6.7.
Price Cny Exw 9.27
Fx Rate Usd Cny 6.7
Price Cny Original 9
Price Is Placeholder 1
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Duty & Tax Estimate (US)

Landed Cost

$1.48

Duty

$0.00

VAT

$0.07

Est. Shipping

$0.03

S

Shenzhen Yijie Testing Technology Co., Ltd.

· 34 products

Integrity

100.00

Fulfillment

100.00

Type

factory

High Integrity Fast Fulfillment
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Produktbeschreibung

Wafer Testing RF Probe| 40GHz Compact Manual Probe Station Failure Analysis FR. Specifications: Brand: GBITEST. Wholesale & OEM/ODM supported. Price varies by order quantity.

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